Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop-Reference-Cited by-同舟云学术

Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop

Published:2016-09 Issue: Volume:64 Page:199-203
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Chua C.T.,Ong H.G.,Sanchez K.,Perdu P.,Gan C.L.

Funder

Providence Health Care

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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