Author:
Takeshita Tatsuya,Iga Ryuzo,Yamamoto Mitsuo,Sugo Mitsuru
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference18 articles.
1. Wallon J, Devold P. Spectral behavior and aging tests of InGaAs/AlGaAs and Al-free 980nm pump laser diodes. ESREF 95, Bordeaux, France, 1995: 415–20.
2. Failure analysis of InGaAs/GaAs strained-layer quantum well lasers using a digital OBIC monitor;Takeshita;IEEE Trans Electron Dev,2006
3. Nikawa K, Inoue S. New capability of OBIRCH method for fault localization and defect detection. In: Proc of Sixth Asian Test Symposium 1997 (ATS ’97), Akita, Japan 1997: 214–9.
4. Scanning near-field optical microscopy analyses of electronic devices;Cramer;Microelectron Reliab,1998
5. Degradation behavior in InGaAs/GaAs strained-quantum well lasers;Takeshita;Microelectron Reliab,1998
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