Identification of the physical signatures of CDM induced latent defects into a DC–DC converter using low frequency noise measurements-Reference-Cited by-同舟云学术

Identification of the physical signatures of CDM induced latent defects into a DC–DC converter using low frequency noise measurements

Published:2007-09 Issue:9-11 Volume:47 Page:1456-1461
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Gao Y.,Guitard N.,Salamero C.,Bafleur M.,Bary L.,Escotte L.,Gueulle P.,Lescouzeres L.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference13 articles.

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