Development of embedded capacitor with bismuth-based pyrochlore thin films at low temperatures for printed circuit board applications-Reference-Cited by-同舟云学术

Development of embedded capacitor with bismuth-based pyrochlore thin films at low temperatures for printed circuit board applications

Published:2007-04 Issue:4-5 Volume:47 Page:755-758
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Park Jong-Hyun,Xian Cheng-Ji,Seong Nak-Jin,Yoon Soon-Gil,Son Seung-Hyun,Chung Hyung-Mi,Moon Jin-Suck,Jin Hyun-Joo,Lee Seung-Eun,Lee Jeong-Won,Kang Hyung-Dong,Chung Yeoul-Kyo,Oh Yong-Soo

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. Borland WJ, Ferguson S. Circuit tree. 2001, March.

2. Overview of low temperature co-fired ceramics tape technology for meso-system technology (MsST)

3. Investigation of the dielectric properties of bismuth pyrochlores

4. Elements of X-ray diffraction;Cullity,2001

5. Realization of a high capacitance density in Bi2Mg2∕3Nb4∕3O7 pyrochlore thin films deposited directly on polymer substrates for embedded capacitor applications

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Design, Modeling, and Fabrication of an Ultra-Thin Planar Capacitor;Journal of Electronic Materials;2023-11-08

2. Effect of oxygen pressure on the structural and electrical properties of Bi2Mg2/3Nb4/3O7 thin films;Vacuum;2023-05

3. Emerging scenario on displacive cubic bismuth pyrochlores (Bi,M)MNO7-δ (M = transition metal, N = Nb, Ta, Sb) in context of their fascinating structural, dielectric and magnetic properties;Ceramics International;2020-07

4. Nanoparticle-Based High-k Dielectric Composites: Opportunities and Challenges;Nanopackaging;2018

5. Effect of excess ZnO on structure and dielectric properties of Bi1.5Zn1.0Nb1.5O7 thin films grown at room temperature by RF magnetron sputtering;Ceramics International;2015-07