Author:
Glavanovics Michael,Köck Helmut,Košel Vladimir,Smorodin Tobias
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. Glavanovics M, Zitta H. Thermal destruction testing: an indirect approach to a simple dynamic thermal model of smart power switches. In: ESSCIRC 2001 proceedings; 2001. p. 236ff.
2. Marie Denison, Single Stress Safe Operating Area of DMOS Transistors integrated in Smart Power Technologies. PhD thesis, University of Bremen, Germany: Shaker Verlag Aachen; 2005.
3. Smorodin T, et al. Power-cycling of DMOSswitches as thermo-mechanically driven failure mechanism. ESSDERC 2007, Munich Germany; 2007.
4. Bosc M, et al. Reliability characterization of LDMOS transistors submitted to multiple energy discharges. In: ISPSD’2000 proceedings Cat.Nr.00CH37094C; 2000.
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献