Author:
Kim Kyungmee O.,Oh Hee-Seok
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference33 articles.
1. The use and evaluation of yield models in integrated circuits manufacturing;Cunningham;IEEE Trans Semicond Manuf,1990
2. Introduction to semiconductor device yield modeling;Ferris-Prabhu,1992
3. An overview of manufacturing yield and reliability modeling for semiconductor products;Kuo;Proc IEEE,1999
4. Reducing baseline defect density through modeling random defect-limited yield;Segal;Micro Mag,2000
5. Extending integrated-circuit yield models to estimate early life reliability;Barnett;IEEE Trans Reliab,2003
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献