Reliability methods and standards-Reference-Cited by-同舟云学术

Reliability methods and standards

Published:2007-09 Issue:9-11 Volume:47 Page:1330-1335
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Bisschop J.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference36 articles.

1. ISO/TS 16949:2002 Ed. 2 Current stage 60.60 TC 176. Quality management systems – Particular requirements for the application of ISO 9001:2000 for automotive production and relevant service part organizations.

2. MIL-STD-883G. Test method standard microcircuits, US Department of Defence; 2006.

3. MIL-STD-750E. Test methods for semiconductor devices. US Department of Defence, 2006.

4. MIL-STD-202G. Test methods of electronic and electrical component Parts; 2002.

5. MIL-HDBK-217F. Reliability prediction of electronic equipment; 1991.

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