Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests-Reference-Cited by-同舟云学术

Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests

Published:2015-12 Issue:12 Volume:55 Page:2654-2662
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Huang Jianlin^ORCID,Golubović Dušan S.,Koh Sau,Yang Daoguo,Li Xiupeng,Fan Xuejun,Zhang G.Q.

Funder

National Science Foundation of China

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference36 articles.

1. An effective prediction method for LED lumen maintenance;Fan,2012

2. Accelerated life test of high brightness light emitting diodes;Trevisanello;IEEE Trans. Device Mater. Reliab.,2008

3. Solid State Lighting Reliability: Components to Systems;van Driel,2012

4. A review on the reliability of GaN-based LEDs;Meneghini;IEEE Trans. Device Mater. Reliab.,2008

5. Study on Ag-plated Cu lead frame and its effect to LED performance under thermal aging;Zhang;IEEE Trans. Device Mater. Reliab.,2014

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