Design and characterization of ESD solutions with EMC robustness for automotive applications-Reference-Cited by-同舟云学术

Design and characterization of ESD solutions with EMC robustness for automotive applications

Published:2015-11 Issue:11 Volume:55 Page:2236-2246
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Xi Yunfeng,Salcedo Javier A.,Zhou Yuanzhong,Liou Juin J.,Hajjar Jean-Jacques

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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