Author:
Raghavan Nagarajan,Frey Daniel D.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference23 articles.
1. Circuit reliability: hot-carrier stress of MOS transistors in different fields of application;Schlünder,2015
2. PBTI-associated high-temperature hot carrier degradation of nMOSFETs with metal-gate/high-κ Dielectrics;Lee;IEEE Electron Device Lett.,2008
3. Prognostics 101: a tutorial for particle filter-based prognostics algorithm using Matlab;An;Reliab. Eng. Syst. Saf.,2013
4. A particle-filtering approach for on-line fault diagnosis and failure prognosis;Orchard;Trans. Inst. Meas. Control.,2009
5. Particle filters for remaining useful life estimation of abatement equipment used in semiconductor manufacturing;Butler,2010
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