Author:
Li Z.F.,Ren Y.,Liu L.L.,Wang Z.L.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. Modularization of fault trees: a method to reduce cost of analysis. Reliability and fault tree analysis;Chatterjee;J. Soc. Ind. Appl. Math.,1975
2. Modules of coherent binary systems;Birnbaum;J. Appl. Math.,1965
3. Decomposition methods for fault tree analysis;Rosenthal;IEEE Trans. Reliab.,1980
4. Finding modules in fault trees;Khoda;IEEE Trans. Reliab.,1989
5. A linear-time algorithm to find modules in fault trees;Dutuit;IEEE Trans. Reliab.,1996
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