Author:
Eftaxiopoulos Nikolaos,Axelos Nicholas,Pekmestzi Kiamal
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference74 articles.
1. The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction;Baumann,2002
2. Impact of voltage scaling on nanoscale SRAM reliability;Chandra,2009
3. The impact of new technology on soft error rates;Dixit,2011
4. Investigation of multi-bit upsets in a 150nm technology SRAM device;Radaelli;IEEE Trans. Nucl. Sci.,2005
5. Multi-cell upset probabilities of 45nm high-k+metal gate SRAM devices in terrestrial and space environments;Seifert,2008
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献