Failure analysis and reliability on system level-Reference-Cited by-同舟云学术

Failure analysis and reliability on system level

Published:2015-08 Issue:9-10 Volume:55 Page:2154-2158
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Jacob P.

Funder

Empa

Empa Industry Pool

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference3 articles.

1. Anamnesis in failure analysis — how a system-related approach can save failure analysis (FA) time, shorten learning loops and reduce cost;Jacob,2013

2. From component to system failure analysis—the future challenge within work-sharing supply chains;Jacob,2011

3. Reliability Engineering — Theory and Practice;Birolini,2014

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3. Matrix Approach to Perform Dependent Failure Analysis in Compliance with Functional Safety Standards;Proceedings of the Third International Conference on Computational Intelligence and Informatics;2020

4. Early Life Failures in Automotive Applications;Microelectronics Failure Analysis;2019

5. A very unusual transistor failure, caused by a solenoid;Microelectronics Reliability;2017-09