Author:
Nowodzinski A.,Chipaux M.,Toraille L.,Jacques V.,Roch J.-F.,Debuisschert T.
Funder
European Union Seventh Framework Programme
DIADEMS
Agence Nationale de la Recherche
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. A new Methodology for Short Circuit Localization on Integrated Circuits using Magnetic Microscopy Technique Coupled with Simulations IEEE Proceedings of 16th IPFA — 2009, China;Infante,2009
2. Space domain reflectometry for open failure localization;Gaudestad,2012
3. Using a magnetometer to image a two dimensional current distribution;Roth;J. Appl. Phys.,1989
4. Magnetometry with nitrogen-vacancy defects in diamond;Rondin;Rep. Prog. Phys.,2014
5. Magnetic Imaging with an Ensemble of Nitrogen Vacancy Centers in Diamond;Chipaux,2014
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