ASTEP (2005–2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure-Reference-Cited by-同舟云学术

ASTEP (2005–2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure

Published:2015-08 Issue:9-10 Volume:55 Page:1506-1511
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Autran J.L.^ORCID,Munteanu D.,Moindjie S.,Saoud T. Saad,Sauze S.,Gasiot G.,Roche P.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference24 articles.

1. Soft Errors: Technology Trends, System Effects and Protection Techniques;Mitra,2007

2. Soft Errors: From Particles to Circuits;Autran,2015

3. Radiation-induced soft errors in advanced semiconductor technologies;Baumann;IEEE Trans. Device Mater. Reliab.,2005

4. SER — History¸Trends and Challenges;Ziegler,2004

5. Standard “Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices”;JEDEC,2006

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