A highly reliable radiation tolerant 13T SRAM cell for deep space applications

Author:

Yekula Ravi Teja,Pandey Monalisa,Islam Aminul

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference50 articles.

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2. CMOS scaling trends and beyond;Bohr;IEEE Micro,2017

3. Radiation-induced soft errors in advanced semiconductor technologies;Baumann;IEEE Trans. Device Mater. Reliab.,2005

4. Single event transients in digital CMOS—a review;Ferlet-Cavrois;IEEE Trans. Nucl. Sci.,2013

5. Geometric effect of multiple-bit soft errors induced by cosmic ray neutrons on DRAM's;Satoh;IEEE Electron Device Lett.,2000

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