Author:
Fogsgaard Martin Bendix,Bahman Amir Sajjad,Iannuzzo Francesco,Blaabjerg Frede
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
3 articles.
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1. Junction Temperature Prediction: A Multi-Featured Dataset Approach;2023 IEEE 8th Southern Power Electronics Conference and 17th Brazilian Power Electronics Conference (SPEC/COBEP);2023-11-26
2. High Cycle Fatigue Testing of Silicon IGBT Devices Under Application-Close Conditions;IEEE Transactions on Power Electronics;2023-11
3. Lifetime analysis of two commercial PV converters using multi-year degradation modelling;e-Prime - Advances in Electrical Engineering, Electronics and Energy;2023-09