Prognosis of LED lumen degradation using Bayesian optimized neural network approach-Reference-Cited by-同舟云学术

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Prognosis of LED lumen degradation using Bayesian optimized neural network approach

Published:2022-11 Issue: Volume:138 Page:114728
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Pugalenthi Karkulali,Lim Sze Li Harry,Park Hyunseok,Hussain Shaista,Raghavan Nagarajan

Funder

Agency for Science, Technology and Research

Ministry of Education - Singapore

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Reliability analysis of LED-based electronic devices;Ignacio;Procedia Eng.,2012

2. A fault diagnosis and prognosis LED lighting system for increasing reliability in energy efficient buildings;Freddi,2013

3. Bias suppression framework for detrending mean of multi-output gaussian process regression in LED remaining storage life prognosis;Harry;IEEE Access,2021

4. Adaptive prognosis of lithium-ion batteries based on the combination of particle filters and radial basis function neural networks;Sbarufatti;J. Power Sources,2017

5. Remaining useful life prediction of lithium-ion batteries using neural network and bat-based particle filter;Wu;IEEE Access,2019

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