A data-driven method for anomaly detection and aging model parameter estimation of capacitors based on condition monitoring

Author:

Lv Chunlin,Liu Jinjun,Zhang Yan

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Reliability of capacitors for DC-link applications in power electronic converters - an overview;Wang;IEEE Trans. Power Electron.,2014

2. Accelerated ageing of metallized film capacitors under high ripple currents combined with a DC voltage;Makdessi;IEEE Trans. Power Electron.,2015

3. An industry-based survey of reliability in power electronic converters;Yang;IEEE Trans. Ind. Appl.,2011

4. Metallized polymer film capacitors ageing law based on capacitance degradation;Makdessi;Microelectron. Reliab.,2014

5. Lifetime estimation of DC-link capacitors in adjustable speed drives under grid voltage unbalances;Wang;IEEE Trans. Power Electron.,2019

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