Author:
Alshaer Ihab,Colombier Brice,Deleuze Christophe,Maistri Paolo,Beroulle Vincent
Funder
Agence Nationale de la Recherche
Labex
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference30 articles.
1. On the Importance of Checking Cryptographic Protocols for Faults;Boneh,1997
2. Fault injection attacks on cryptographic devices: Theory, practice, and countermeasures;Barenghi;Proc. IEEE,2012
3. Radiation-induced soft errors in advanced semiconductor technologies;Baumann;IEEE Trans. Device Mater. Reliab.,2005
4. Laser-induced Single-bit Faults in Flash Memory: Instructions Corruption on a 32-bit Microcontroller;Colombier,2019
5. An end-to-end approach for multi-fault attack vulnerability assessment;Werner,2020
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献