Author:
de Filippis Stefano,Košel Vladimír,Dibra Donald,Decker Stefan,Köck Helmut,Irace Andrea
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Spirito P, Breglio G, d’Alessandro V, Rinaldi N. Thermal instabilities in high current power MOS devices: experimental evidence, electro-thermal simulations and analytical modeling. In: Proceedings of MIEL 2002, vol. 1, Niš, Yugoslavia, 12–15 May 2002. p. 23–30.
2. Electro-thermal circuit simulation using simulator coupling;Wünsche;IEEE Trans VLSI,1997
3. Coupled electro-thermal simulation of a DC/DC converter;Vellvehi;Microelectron Reliab,2007
4. New developments of THERMOS3, a tool for 3D electro-thermal simulation of smart power MOSFETs;Irace;Microelectron Reliab,2007
5. Hauck T, Teulings W, Rudnyi E. Electro-thermal simulation of multi-channel power devices on PCB with SPICE. In: Proc of THERMINIC 2009, Leuven, Belgium, 7–9 October 2009. p. 124–9.
Cited by
17 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献