Investigation of dynamic color deviation mechanisms of high power light-emitting diode-Reference-Cited by-同舟云学术

Investigation of dynamic color deviation mechanisms of high power light-emitting diode

Published:2012-05 Issue:5 Volume:52 Page:866-871
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Fu Han-Kuei,Lin Chin-Wei,Chen Tzung-Te,Chen Chiu-Ling,Chou Pei-Ting,Sun Chien-Jen

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

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5. Illumination grade white LEDs;Mueller;Proc SPIE,2002

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