Investigations of thermal interfaces aging under thermal cycling conditions for power electronics applications

Author:

Ousten J.P.,Khatir Z.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Narumanchi S, Mihalic M, Kelly K. Thermal interface materials for power electronics applications. In: IEEE intersociety conference on thermal and thermomechanical phenomena in electronic systems, Orlando, United States; July 2008.

2. Temperature effect during humid ageing on interfaces of glass and carbon fibers reinforced epoxy composites;Ray;J Colloid Interf Sci,2006

3. Schulz M. Evaluating TIM below power electronics modules separating measurement from fortune-telling. ECPE Workshop, Nuremberg, Germany; May 2010.

4. Scheuermann U. Experience with TIMs in qualification and field applications. ECPE Workshop, Nuremberg, Germany; May 2010.

5. American Society for Testing and Materials. Standard test methods for thermal transmission properties of thin thermally conductive solid electrical insulation materials. ASTM Standard D5470-06; 2006.

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3