Author:
Brusamarello Lucas,Wirth Gilson I.,Roussel Philippe,Miranda Miguel
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference24 articles.
1. Design for reliability;Minehane;Microelectron Reliab,2000
2. Challenges in gate level modeling for delay and si at 65nm and below;Keller,2008
3. The monte carlo method in science and engineering;Amar;Comput Sci Eng,2006
4. S. OpenEDA. Si2 effective current source model (ECSM) statistical extensions specification. Visited on November 2010 (September 2007).
5. Computer-aided design of integrated circuits and systems;Alvarez;IEEE Trans,1988
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献