Fast and accurate statistical characterization of standard cell libraries-Reference-Cited by-同舟云学术

Fast and accurate statistical characterization of standard cell libraries

Published:2011-12 Issue:12 Volume:51 Page:2341-2350
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Brusamarello Lucas,Wirth Gilson I.,Roussel Philippe,Miranda Miguel

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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