Ion Beams for Material Analysis-Reference-Cited by-同舟云学术

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Ion Beams for Material Analysis

Published:2003 Issue: Volume: Page:55-63
ISSN:
Container-title:Encyclopedia of Physical Science and Technology
language:
Short-container-title:

Author:

Cohen David D.,Bird Roger,Dytlewski Nick,Siegele Rainer

Publisher

Elsevier

Reference23 articles.

1. Secondary Ion Mass Spectrometry. SIMS VI,1988

2. Ion Beams for Materials Analysis,1989

3. Materials analysis using a nuclear microprobe;Breese,1996

4. Backscattering Spectrometry;Chu,1978

5. Applications of simultaneous IBA techniques to aerosol analysis

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1. Prior implantation of hydrogen as a mechanism to delay helium bubbles, blistering, and exfoliation in titanium;Journal of Nuclear Materials;2024-06

2. ToF-SIMS in material research: A view from nanoscale hydrogen detection;Materials Today;2024-06

3. Analysis of Hydrogen in Inorganic Materials and Coatings: A Critical Review;Hydrogen;2021-06-04

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