ESCA Microscopy at ELETTRA: what it is like to perform spectromicroscopy experiments on a third generation synchrotron radiation source
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Published:1997-03
Issue:1-3
Volume:84
Page:73-83
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ISSN:0368-2048
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Container-title:Journal of Electron Spectroscopy and Related Phenomena
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language:en
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Short-container-title:Journal of Electron Spectroscopy and Related Phenomena
Author:
Marsi M,Casalis L,Gregoratti L,Günther S,Kolmakov A,Kovac J,Lonza D,Kiskinova M
Subject
Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials
Reference26 articles.
1. See, for instance, Soft X-ray microscopy, C. Jacobsen and J. Trebes (Eds.), Proc. SPIE, 1741 (1993); 2. G. Margaritondo, F. Cerrina, Nucl. Instrum. Methods Phys. Res. Sect. A, 291 (1990) 26; B.P. Tonner, Nucl. Instrum. Methods Phys. Res. Sect. A, 291 (1990) 60; E. Bauer, Ultramicroscopy, 36 (1991) 52. 3. For the Fresnel zone plate SPEM at the NSLS see, for instance, H. Ade, J. Kirz, S. Hulbert, E. Johnson, E. Anderson, D. Kern, J. Vac. Sci. Technol. A, 9 (1991) 1902; C.-H. Ko, J. Kirz, H. Ade, E. Johnson, S. Hulbert, E. Anderson, Mater. Res. Soc. Proc., 375 (1995) 303 and references therein. 4. MAXIMUM is a SPEM based on the use of a Schwarzchild objective. See, for instance, W. Ng, A.K. Ray-Chaudhuri, S. Liang, S. Singh, H. Solak, J. Welnak, F. Cerrina, G. Margaritondo, J.H. Underwood, J.B. Kortright, R.C.C. Perera, Nucl. Instrum. Methods Phys. Res. Sect. A, 347 (1994) 422; F. Cerrina, A.K. Ray-Chaudhuri, W. Ng, S. Liang, S. Singh, J.T. Welnak, J.P. Wallace, C. Capasso, J.H. Underwood, J.B. Kortright, R.C.C. Perera, G. Margaritondo, Appl. Phys. Lett., 63 (1993) 63 and references therein. 5. For photoemission microscopy activities at HASYLAB see, for instance, J. Voss, H. Dadras, C. Kunz, A. Moewes, G. Roy, H. Sievers, I. Storjohann, H. Wongel, J. X-ray Sci. Technol., 3 (1992) 85; J. Voss, I. Storjohann, C. Kunz, A. Moewes, M. Pretorius, A. Ranck, H. Sievers, V. Wedemeier, M. Wochnowski, H. Zhang, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20–24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 103.
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