Non-destructive depth profiling of solid samples by atomic and nuclear interactions induced by charged particles-Reference-Cited by-同舟云学术

Non-destructive depth profiling of solid samples by atomic and nuclear interactions induced by charged particles

Published:2003-06 Issue:2-3 Volume:129 Page:243-271
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Demortier Guy

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference73 articles.

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