Near-infrared light emission of Er3+-doped zirconium oxide thin films: An optical, structural and XPS study-Reference-Cited by-同舟云学术

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Near-infrared light emission of Er3+-doped zirconium oxide thin films: An optical, structural and XPS study

Published:2015-01 Issue: Volume:619 Page:800-806
ISSN:0925-8388
Container-title:Journal of Alloys and Compounds
language:en
Short-container-title:Journal of Alloys and Compounds

Author:

Clabel H. J.L.,Rivera V.A.G.,Siu Li M.,Nunes L.A.O.,Leite E.R.,Schreiner W.H.,Marega E.

Funder

Brazilian agencies CAPES

FAPESP

INOF/CEPOF

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

Reference37 articles.

1. Properties of zirconia thin films prepared by reactive magnetron sputtering;Hembram;Mater. Lett.,2007

2. Structural and optical properties of zirconia thin films;Krishna;Thin Solid Films,1990

3. Study of erbium doped ZrO2waveguides elaborated by a sol–gel process;Urlacher;Opt. Mater.,1999

4. Interfacial and microstructural properties of zirconium oxide thin films prepared directly on silicon;Zhang;Appl. Surf. Sci.,2002

5. Effect of O2gas partial pressure on structures and dielectric characteristics of rf sputtered ZrO2thin films;Ma;Appl. Surf. Sci.,2007

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