Improved leakage property and reduced crystallization temperature by V2O5 seed layer in K0.4Na0.6NbO3 thin films derived from chemical solution deposition-Reference-Cited by-同舟云学术

Improved leakage property and reduced crystallization temperature by V2O5 seed layer in K0.4Na0.6NbO3 thin films derived from chemical solution deposition

Published:2013-03 Issue: Volume:552 Page:269-273
ISSN:0925-8388
Container-title:Journal of Alloys and Compounds
language:en
Short-container-title:Journal of Alloys and Compounds

Author:

Li N.,Li W.L.,Wang L.D.,Xu D.,Chi Q.G.,Fei W.D.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

Reference30 articles.

1. Lead-free piezoceramics

2. Phase transitional behavior and piezoelectric properties of (Na0.5K0.5)NbO3–LiNbO3 ceramics

3. Piezoelectric properties of (K0.5Na0.5)(Nb1−xTax)O3−K5.4CuTa10O29 ceramics

4. High throughput method for K0.5Na0.5NbO3 thin films preparation by chemical solution deposition

5. Fabrication and ferroelectric properties of highly dense lead-free piezoelectric (K0.5Na0.5)NbO3 thick films by aerosol deposition

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