Structure and electrical conductivity of nanocomposite SiOxNy(Si) and SiAlzOxNy(Si) films-Reference-Cited by-同舟云学术

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Structure and electrical conductivity of nanocomposite SiOxNy(Si) and SiAlzOxNy(Si) films

Published:2023-10 Issue: Volume:960 Page:170879
ISSN:0925-8388
Container-title:Journal of Alloys and Compounds
language:en
Short-container-title:Journal of Alloys and Compounds

Author:

Evtukh A.,Kizjak A.,Bratus’ O.,Voitovych M.,Romanyuk V.,Mamykin S.,Antonin S.,Muriy Ya.,Klymenko V.,Sarikov A.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

Reference69 articles.

1. A silicon nanocrystals based memory;Tiwari;Appl. Phys. Lett.,1996

2. Nanocomposite SiO2(Si) films as a medium for non-volatile memory;Bratus’;J. Non-Cryst. Solids,2008

3. Electrical characterization of SiO2 (Si) films as a medium for charge storage;Evtukh;Phys. Status Solidi C.,2008

4. Charge transport mechanism of high-resistive state in RRAM based on SiOx;Gismatulin;Appl. Phys. Lett.,2019

5. Enhanced photoresponse of a metal-oxide-semiconductor photodetector with silicon nanocrystals embedded in the oxide layer;Shieh;Appl. Phys. Lett.,2007

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Negative Capacitance and Dielectric Constant of Nanocomposite SiAl_zO_xN_y(Si) Films with Semiconductor Nanoparticles;Nano Letters;2024-01-02

2. Thermodynamic Theory of Phase Separation in Nonstoichiometric Si Oxide Films Induced by High-Temperature Anneals;Nanomanufacturing;2023-07-03

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