Investigation of reflectometry for in situ process monitoring and characterization of co-evaporated and stacked Cu-Zn-Sn-S based thin films
Author:
Funder
European Union’s Seventh Framework Program
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials
Reference37 articles.
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3. Reactively sputtered films in the CuxS–ZnS–SnSy system: from metastability to equilibrium;Ren;Thin Solid Films,2015
4. On the Sn loss from thin films of the material system Cu-Zn-Sn-S in high vacuum;Weber;J. Appl. Phys.,2010
5. Studies of Cu2ZnSnS4 Films Prepared by Sulfurisation of Electrodeposited Precursors;Scragg,2010
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1. Nontoxic and earth-abundant Cu2ZnSnS4 (CZTS) thin film solar cells: A review on high throughput processed methods;Materials Today Sustainability;2024-03
2. In Situ Analyses of Surface-Layer Composition of CxNy Thin Films Using Methods Based on Penning Ionization Processes—Introductory Investigations;Materials;2021-12-17
3. Effect of volume of the solution and sulfurization on properties of Cu2ZnSnS4 thin films fabricated by spray assisted chemical vapour deposition method;Materials Research Innovations;2021-03-30
4. Effect of tin concentration on the structural, optical and thermoelectric properties of CZTS thin films gown by chemical solution method;Ceramics International;2019-12
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