Residual stress of Pb(ZrxTi1−x)O3 films with mixed textures
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials
Reference30 articles.
1. Piezoelectric Actuators and Ultrasonic Motors;Uchino,1996
2. Phase Diagram ofPb(Zr,Ti)O3Solid Solutions from First Principles
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1. Effects of LaNiO3 Seed Layer on the Microstructure and Electrical Properties of Ferroelectric BZT/PZT/BZT Thin Films;Frontiers in Materials;2021-09-15
2. Growth orientation-related enhancement of electrical properties in (Na0.85K0.15)0.5Bi0.5TiO3-based composite films;Journal of the European Ceramic Society;2019-02
3. Evaluation on residual stress in Bi3.15(Eu0.7Nd0.15)Ti3O12 polycrystalline ferroelectric thin film by using the orientation average method;Applied Physics Letters;2012-12-03
4. Effect of grain orientation in x-ray diffraction pattern on residual stress in polycrystalline ferroelectric thin film;Journal of Applied Physics;2012-08-15
5. Dependence of lattice distortion of monoclinic phase on film thickness in Pb(Zr0.58Ti0.42)O3 thin films;Journal of Alloys and Compounds;2011-02
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