X-ray absorption near-edge structure of hexagonal ternary phases in sputter-deposited TiAlN films-Reference-Cited by-同舟云学术

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X-ray absorption near-edge structure of hexagonal ternary phases in sputter-deposited TiAlN films

Published:2013-06 Issue: Volume:561 Page:87-94
ISSN:0925-8388
Container-title:Journal of Alloys and Compounds
language:en
Short-container-title:Journal of Alloys and Compounds

Author:

Gago R.,Soldera F.,Hübner R.,Lehmann J.,Munnik F.,Vázquez L.,Redondo-Cubero A.,Endrino J.L.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

Reference48 articles.

1. Thermal stability of nitride thin films

2. Characterization of nitride coatings by Auger electron spectroscopy and x‐ray photoelectron spectroscopy

3. Titanium aluminum nitride films: A new alternative to TiN coatings

4. Mechanical properties and machining performance of Ti1−xAlxN-coated cutting tools

5. Single layer and multilayer wear resistant coatings of (Ti,Al)N: a review

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1. Effects of thermal treatment on the electrical behavior of titanium dioxide thin-films;Emergent Materials;2024-04-23

2. Structural changes in Ti1-xAlxN coatings during turning: A XANES and EXAFS study of worn tools;Applied Surface Science;2023-03

3. Vacuum Thermal Treatments for Surface Engineering of Selective Laser Melted Ti6Al4V Alloy;Journal of Materials Engineering and Performance;2021-07-28

4. Implementing sustainability in laboratory activities: A case study on aluminum titanium nitride based thin film magnetron sputtering deposition onto commercial laminated steel;Journal of Cleaner Production;2021-02

5. Bias Voltage for Avoiding Fatigue Strength Degradation Due to TiAlN Coating on Ti-Alloy Substrates;Journal of Materials Engineering and Performance;2021-01-25

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