Microstructure characterization of titanium-base aluminium alloys by X-ray diffraction using Warren–Averbach and Rietveld method
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials
Reference39 articles.
1. Microstructural studies on lattice imperfections in irradiated titanium and Ti-5 Pct Ta-2 Pct Nb by X-ray diffraction line-profile analysis
2. Surface modification and characterisation of Ti–Al–V alloys
3. A study of alloying behaviour in the Ti–Al–V system
4. An X-ray diffraction study of defect parameters in a Ti-base alloy
5. Tensile properties and microstructure of Ti–48Al–2W–0·5Si γ-titanium aluminide at temperatures between room temperature and 800°
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