KKR–CPA study of electronic structure and relative stability of Mg2X (<mml:math altimg="si17.gif" overflow="scroll" xmlns:xocs="http://www.elsevier.com/xml/xocs/dtd" xmlns:xs="http://www.w3.org/2001/XMLSchema" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.elsevier.com/xml/ja/dtd" xmlns:ja="http://www.elsevier.com/xml/ja/dtd" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:tb="http://www.elsevier.com/xml/common/table/dtd" xmlns:sb="http://www.elsevier.com/xml/common/struct-bib/dtd" xmlns:ce="http://www.elsevier.com/xml/common/dtd" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:cals="http://www.elsevier.com/xml/common/cals/dtd" xmlns:sa="http://www.elsevier.com/xml/common/struct-aff/dtd"><mml:mrow><mml:mi>X</mml:mi></mml:mrow></mml:math>=Si, Ge, Sn) thermoelectrics containing point defects-Reference-Cited by-同舟云学术

KKR–CPA study of electronic structure and relative stability of Mg2X (X=Si, Ge, Sn) thermoelectrics containing point defects

Author:

Zwolenski P.,Tobola J.,Kaprzyk S.

Funder

Polish National Science Centre

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

Reference19 articles.

5. Diffusion and defect data solid state data. Pt. B;Tobola;Solid State Phenomena,2013

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