Critical thickness of contact melting in the Au/Ge layered film system-Reference-Cited by-同舟云学术

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Critical thickness of contact melting in the Au/Ge layered film system

Published:2012-01 Issue:1 Volume:512 Page:311-315
ISSN:0925-8388
Container-title:Journal of Alloys and Compounds
language:en
Short-container-title:Journal of Alloys and Compounds

Author:

Kryshtal A.P.,Sukhov R.V.,Minenkov A.A.

Funder

Ministry of Education and Science of Ukraine

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

Reference10 articles.

1. The Nature of Eutectic Alloys and the Contact Melting Effect;Zalkin,1987

2. Melting and superheating of crystalline solids: From bulk to nanocrystals

3. Melting point lowering of thin metal films (Me = In, Sn, Bi, Pb) in Al/Me/Al film system

4. Contact melting in layered film systems of the eutectic type

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1. Supercooling During the Crystallization of Alloys in Condensed Films;Formation and Temperature Stability of the Liquid Phase in Thin-Film Systems;2023-11-26

2. Crystallization of Free Particles and Island Films;Formation and Temperature Stability of the Liquid Phase in Thin-Film Systems;2023-11-26

3. Eutectic crystallization and melting in sharp concentration gradients;The Journal of Chemical Physics;2023-04-24

4. Effect of Size on the Formation of Solid Solutions in Ag–Cu Nanoparticles;The Journal of Physical Chemistry C;2023-01-30

5. Metal-induced crystallization of amorphous semiconductor films: Nucleation phenomena in Ag-Ge films;Applied Surface Science;2022-12

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