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Residual stress measurements in melt infiltrated SiC/SiC ceramic matrix composites using Raman spectroscopy

  • Published:2018-07 Issue:7 Volume:38 Page:2784-2791
  • ISSN:0955-2219
  • Container-title:Journal of the European Ceramic Society
  • language:en
  • Short-container-title:Journal of the European Ceramic Society

Author:

Kollins Kaitlin,Przybyla Craig,Amer Maher S.

Funder

Air Force Office of Scientific Research

Publisher

Elsevier BV

Subject

Materials Chemistry,Ceramics and Composites

Reference48 articles.

1. Ceramic matrix composites;Bansal,2014

2. SiC/SiC composites for 1200°C and above;DiCarlo,2005

3. Microstructure and Properties of Materials: (Volume 2), World Scientific;Li,2000

4. Some defects in crystals grown from the melt. I. defects caused by thermal stresses;Billig,1956

5. Microstress in reaction-bonded SiC from crytallization expansion of silicon;Wing;J. Am. Ceram. Soc.,2016

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