High resolution electron microscopic studies of the oxidation process of ZnTe films
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference7 articles.
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2. Polarity and inversion twins in ZnSe crystals observed by high-resolution electron microscopy
3. High resolution transmission electron microscopy investigation of adsorption and growth of Au on ZnTe surfaces
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. II-VI Wide-Bandgap Semiconductor Device Technology: Stability and Oxidation;Handbook of II-VI Semiconductor-Based Sensors and Radiation Detectors;2023
2. Preparation of nanocomposite for optical application using ZnTe nanoparticles and a zero-birefringence polymer;Journal of Materials Science;2007-10
3. X-ray and electron microscopic determination of Debye characteristic temperature, stacking fault energy and other microstructural parameters in zinc telluride films;Zeitschrift für Kristallographie;1990-01
4. Study of epitaxial growth of ZnTe on GaAs (001) by channeling;Journal of Applied Physics;1988-07-15
5. The observation of in situ and ex situ oxidation processes for ZnTe surfaces by high-resolution electron microscopy;Physica Status Solidi (a);1988-06-16
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