Characterization of electronic devices and materials by surface-sensitive analytical techniques-Reference-Cited by-同舟云学术

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Characterization of electronic devices and materials by surface-sensitive analytical techniques

Published:1980-04 Issue:3-4 Volume:4 Page:410-444
ISSN:0378-5963
Container-title:Applications of Surface Science
language:en
Short-container-title:Applications of Surface Science

Author:

Holloway P.H.,McGuire G.E.

Publisher

Elsevier BV

Subject

General Engineering

Reference440 articles.

1. New Developments in the Surface Analysis of Solids;Benninghoven;Appl. Phys.,1973

2. Micro Analysis of Thin Film Surface Layers;Canali;Alta Freq. (Italy),1976

3. Photoelectron and Auger Spectroscopy;Carlson,1976

4. Methods of Surface Analysis,1975

5. SIMS Application in the Investigation of Surfaces, Thin Films and Sandwich Structures with Special Regard to Quantitative Analysis;Giber;Thin Solid Films,1976

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2. Use of aluminum oxide as a permeation barrier for producing thin films on aluminum substrates;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2016-07

3. Introduction;Surface Analysis and Techniques in Biology;2014

4. Augerelektronenspektroskopie (AES) zur Untersuchung von Festkörperoberflächen - Stand und neuere Entwicklungen auf den Gebieten der quantitativen Analyse und der chemischen Information;Zeitschrift für Chemie;2010-08-31

5. Auger Spectroscopy;digital Encyclopedia of Applied Physics;2003-04-15

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