Measurement of low energy secondary electron distributions using a double-pass cylindrical mirror analyzer-Reference-Cited by-同舟云学术

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Measurement of low energy secondary electron distributions using a double-pass cylindrical mirror analyzer

Published:1980-04 Issue:3-4 Volume:4 Page:271-281
ISSN:0378-5963
Container-title:Applications of Surface Science
language:en
Short-container-title:Applications of Surface Science

Author:

Chase R.E.,Gordon W.L.,Hoffman R.W.

Publisher

Elsevier BV

Subject

General Engineering

Reference21 articles.

1. Handbook of Auger Electron Spectroscopy;Davis,1976

2. Physical Electronics Division, Perkin-Elmer Corporation, Model 15-255G.

3. A combined ESCA and Auger spectrometer

4. Transmission properties of a cylindrical mirror analyzer viewed in energy‐angle space

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1. Evolution of Secondary Electrons Emission During EUV Exposure in Photoresists;Journal of Photopolymer Science and Technology;2021-06-11

2. Monte Carlo simulation of electron emission from solids;Journal of Electron Spectroscopy and Related Phenomena;1999-12

3. Emission of Backscattered and Secondary Electrons;Springer Series in Optical Sciences;1998

4. Picosecond Photoemission Probing;Electron Beam Testing Technology;1993

5. High electron density effects in electron spectroscopies: Consequences for picosecond photoemission and electron‐beam sampling;Journal of Applied Physics;1989-06

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