Application of UV light for studying surface reactions in layer structures-Reference-Cited by-同舟云学术

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Application of UV light for studying surface reactions in layer structures

Published:1980-09 Issue:1 Volume:6 Page:15-28
ISSN:0378-5963
Container-title:Applications of Surface Science
language:en
Short-container-title:Applications of Surface Science

Author:

Litovchenko V.G.,Lisovskii I.P.,Litvinov R.O.

Publisher

Elsevier BV

Subject

General Engineering

Reference23 articles.

1. Radiatsionnye povrezhdeniya v tverdykh telakh;Litvinov,1974

2. Illumination with Ultraviolet Light of MOS Capacitors

3. Effect of UV illumination on the electrical properties of MOS layer structures

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of Radiation on the Luminescence of Silicon Nanocrystals Embedded into SiO2Film;Journal of Nanomaterials;2016

2. Field mechanism of defect generation at SiSiO2 interface under hot electron injection;Journal of Non-Crystalline Solids;1995-07

3. Proton release and defect creation in MOS structures due to high electric fields;Physica Status Solidi (a);1994-03-16

4. FIELD-INDUCED IONIZATION AND EMISSION OF ELECTRONS AND IONS IN MIS STRUCTURES;Le Journal de Physique Colloques;1988-11

5. The study of slow relaxation of charged centres in insulator–semiconductor structures using fluorescent molecule probes;physica status solidi (a);1985-11-16

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