Author:
Morgan A.E.,de Grefte H.A.M.,Warmoltz N.,Werner H.W.,Tolle H.J.
Cited by
90 articles.
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1. Improved uranium particle analysis by SIMS using O3− primary ions;Journal of Analytical Atomic Spectrometry;2022
2. Order-of-magnitude differences in retention of low-energy Ar implanted in Si and SiO2;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2016-09
3. Uranium ion yields from monodisperse uranium oxide particles;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2016-05
4. Unravelling the secrets of Cs controlled secondary ion formation: Evidence of the dominance of site specific surface chemistry, alloying and ionic bonding;Surface Science Reports;2013-03
5. Investigation of the factors determining the SIMS depth resolution in silicon-isotope multiple layers;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2012-01