Quantitative Auger electron spectroscopy and Rutherford backscattering of potassium-implanted silicon, silica and sodium trisilicate-Reference-Cited by-同舟云学术

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Quantitative Auger electron spectroscopy and Rutherford backscattering of potassium-implanted silicon, silica and sodium trisilicate

Published:1984-12 Issue:1-2 Volume:20 Page:167-180
ISSN:0378-5963
Container-title:Applications of Surface Science
language:en
Short-container-title:Applications of Surface Science

Author:

Burrow Brad J.,Armstrong Neal R.,Quinn Rod K.,Bunker Bruce C.,Arnold George W.,Salmi Doug R.

Publisher

Elsevier BV

Subject

General Engineering

Reference47 articles.

1. Characterization of the Materials Comprising the Reactive Interfaces in the Li ( Si ) / FeS2 Primary Battery

2. Performance Characteristics of Solid Lithium‐Aluminum Alloy Electrodes

3. SAND82–0785;Bro,1982

4. Potential distribution model for rechargeable sulphur electrodes in sodium-sulphur cells

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effects of ion implantation on the hardness and friction behaviour of soda-lime silica glass;Journal of Materials Science;1992

2. QUANTITATION OF AUGER AND X-RAY PHOTOELECTRON SPECTROSCOPIES;ANAL CHEM;1989

3. Quantitative surface electron spectroscopies: Application to the study of corrosion of metals and glasses;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1988-05

4. Reactions of evaporated lithium films with silica surfaces;Applied Surface Science;1986-12

5. Surface analysis: x-ray photoelectron spectroscopy and Auger electron spectroscopy;Analytical Chemistry;1986-04-01

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