Quantitative Auger electron spectroscopy and Rutherford backscattering of potassium-implanted silicon, silica and sodium trisilicate
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference47 articles.
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1. Effects of ion implantation on the hardness and friction behaviour of soda-lime silica glass;Journal of Materials Science;1992
2. QUANTITATION OF AUGER AND X-RAY PHOTOELECTRON SPECTROSCOPIES;ANAL CHEM;1989
3. Quantitative surface electron spectroscopies: Application to the study of corrosion of metals and glasses;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1988-05
4. Reactions of evaporated lithium films with silica surfaces;Applied Surface Science;1986-12
5. Surface analysis: x-ray photoelectron spectroscopy and Auger electron spectroscopy;Analytical Chemistry;1986-04-01
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