A novel CMA alignment technique for Auger spectroscopy-Reference-Cited by-同舟云学术

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A novel CMA alignment technique for Auger spectroscopy

Published:1984-05 Issue:1-2 Volume:18 Page:18-27
ISSN:0378-5963
Container-title:Applications of Surface Science
language:en
Short-container-title:Applications of Surface Science

Author:

Geller Joseph D.

Publisher

Elsevier BV

Subject

General Engineering

Reference9 articles.

1. Scanning Electron Microscopy;Legressus,1982

2. Results of a joint auger/esca round robin sponsored by astm committee E-42 on surface analysis. Part II. Auger results

3. Handbook of Auger Spectroscopy;Davis,1972

4. Handbook of Auger Spectroscopy;Davis,1976

5. Auger Electron Spectroscopy Reference Manual;McGuire,1980

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The alignment of spectrometers and quantitative measurements in X-ray photoelectron spectroscopy;Journal of Electron Spectroscopy and Related Phenomena;1997-12

2. Computer‐centric rotational depth profiling;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1994-07

3. Dependence of cylindrical mirror analyzer resolution on the geometry of the measurement;Journal of Electron Spectroscopy and Related Phenomena;1991-02

4. Can Auger spectra vary with change of the beam‐sample‐analyzer assembly geometry?;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1990-11

5. AES: Energy calibration of electron spectrometers. II?results of a BCRinterlaboratory comparison co-sponsored by the vamas SCS TWP;Surface and Interface Analysis;1990-05

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