Comparison of high energy ion beam and electron beam surface probes-Reference-Cited by-同舟云学术

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Comparison of high energy ion beam and electron beam surface probes

Published:1982-08 Issue:1-2 Volume:13 Page:211-230
ISSN:0378-5963
Container-title:Applications of Surface Science
language:en
Short-container-title:Applications of Surface Science

Author:

Feldman L.C.

Publisher

Elsevier BV

Subject

General Engineering

Reference45 articles.

1. Atomic positions of surface atoms using high energy ion scattering

2. Back Scattering Spectrometry;Chu,1978

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Applications of surface analysis in materials science and technology;Fresenius' Zeitschrift für analytische Chemie;1988-01

2. Rutherford Backscattering Spectrometry on Thin Solid Films;Treatise on Materials Science & Technology;1988

3. Ion Beam Studies of Crystal and Interface Atomic Structure;Nuclear Physics Applications on Materials Science;1988

4. Characterization of epitaxial group II fluoride films on (100)-oriented GaAs substrates by ion backscattering and channeling;Crystal Research and Technology;1987-07

5. Analysis technology for VLSI fabrication;Proceedings of the IEEE;1987

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