CMOS temperature sensors and built-in test circuitry for thermal testing of ICs-Reference-Cited by-同舟云学术

CMOS temperature sensors and built-in test circuitry for thermal testing of ICs

Published:1998-11 Issue:1-2 Volume:71 Page:10-18
ISSN:0924-4247
Container-title:Sensors and Actuators A: Physical
language:en
Short-container-title:Sensors and Actuators A: Physical

Author:

Székely V.,Rencz M.,Török S.,Márta Cs.,Lipták-Fegó L.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Thermal monitoring of safety-critical integrated systems;Székely,1996

2. Thermal testing methods to increase system reliability;Székely,1997

3. Smart temperature sensor in CMOS technology;Krummenacher;Sensors and Actuators A,1990

4. An analogue temperature sensor integrated in the CMOS technology;Wójciak,1995

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