Atomic force microscope for planetary applications-Reference-Cited by-同舟云学术

Atomic force microscope for planetary applications

Published:2001-07 Issue:3 Volume:91 Page:321-325
ISSN:0924-4247
Container-title:Sensors and Actuators A: Physical
language:en
Short-container-title:Sensors and Actuators A: Physical

Author:

Akiyama T.,Gautsch S.,de Rooij N.F.,Staufer U.,Niedermann Ph.,Howald L.,Müller D.,Tonin A.,Hidber H.-R.,Pike W.T.,Hecht M.H.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. Optical properties of the Martian aerosols as derived from Imager for Mars Pathfinder midday sky brightness data

2. New views of Mars eolian activity, materials, and surface properties: Three vignettes from the Mars Global Surveyor Mars Orbiter Camera

3. Atomic resolution with an atomic force microscope using piezoresistive detection

4. Advanced deep reactive ion etching: a versatile tool for microelectromechanical systems

5. Mounting of micromachined diamond tips and cantilevers

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