In-plane electronic speckle pattern shearing interferometry
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. An image-shearing speckle-pattern interferometer for measuring bending moments;Leendertz;J. Phys. E: Sci. Inst.,1973
2. A speckle shearing interferometer: A tool for measuring derivatives of surface displacements;Hung;Optics Commun.,1974
3. Simultaneous measurement of three displacement derivatives using a multiple image-shearing interferometric camera;Hung;J. Strain Analysis,1979
4. Image-shearing camera for direct measurement of surface strains;Hung;Appl. Opt.,1979
5. Statistical properties of phase variation in shearing speckle interferometry and its effect on fringe visibility;Ng;J. Modern Optics,1992
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