Detection of surface microstructure changes by electronic speckle pattern interferometry
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. Holographic and Speckle Interferometry;Jones,1983
2. Long-distance electronic speckle pattern interferometry;Løkberg;Opt. Engng.,1988
3. The use of electronic speckle pattern interferometry (ESPI) in the crack propagation analysis of epoxy resins;Herbert;Optics Lasers Engng.,1984
4. Electronic speckle pattern interferometry system for in situ deformation monitoring on buildings;Gülker;Opt. Engng.,1990
5. Correlation holographic and speckle interferometry;Ostrowsky,1992
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