3D strain measurements using ESPI
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Holographic Interferometry;Vest,1979
2. Speckle pattern and holographic techniques in engineering metrology;Butters;Opt. and Laser Technol.,1971
3. Electronic speckle pattern interferometry;Lokberg;Phys. Technol.,1980
4. An ESPI contouring technique in strain analysis;Winther;SPIE Proc. Symp. Optika '84,1984
5. The generation of three-dimensional contour maps by wavefront reconstruction;Hildebrand;Phys. Lett.,1966
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